Product History

1981

VACGEN

Swedish physicist Kai Siegbahn winner of the Nobel Prize starts using VG equipment.

Pioneering science is performed using Ultra high vacuum technology designed and built by VG.
1984

OMICRON

First product the SPECTALEED is developed

Advances in LEED design give rise to the SPECTALEED range of products, which offers far brighter, higher resolution analysis of electron diffraction.
1987

OMICRON

First Scanning tunneling microscope, STM1 developed

Ultra high vacuum based surface research and analysis takes a major leap forward with the development of the STM capable of rasterising across a surface rather than single point analysis.

1994

SCIENTA AB

SCIENTA Parallel angle resolved photoelectron spectroscopy technique pioneered

As surface science analysis becomes a dominant research tool for much to the scientific community, SCIENTA enhances the field of spectroscopy with a unique measurement technique.
1999

OMICRON

UHV Nano Probe developed

Tapered optical analysis tool (100 nm wide) developed by OMICRON for surface analysis and RAMAN scattering experiments.
2002

SCIENTA

First results for 1 meV resolution published

With a focus on electron spectroscopy, SCIENTA develop an in vacuum analyser capable of resolving information to 1 meV. The subsequent technical paper written is a world first..

2004

SCIENTA SENSOR SYSTEMS

First Installation for the Swedish Defence Research Agency (FOI)

Used for the detection of worldwide nuclear events and used to ensure non-proliferation treaty compliance, Scienta Sensor systems (SAUNA) build and install the first dedicated system to detect resultant noble gas emmisions.
2005

SCIENTA SENSOR SYSTEMS

The first SAUNA II system installed

Building on the delivery of the first detection system, a second, more advanced unit is created and deployed.
2007

OMICRON

Wins R&D 100 award for the development of the NanoESCA system

The field of electron spectroscopy has advanced year on year, and OMICRON is recognised for its contribution to the field.

2008

SCIENTA AB

First Angle Resolved Time of Flight Spectrometer released into the market

Building on ARPES technology, Scienta builds the first Angle resolved TOF spectrometer for studying the surfaces of 2D materials.
2008

SCIENTA AB

VG Scienta’s Dr Bjorn Wannberg wins the American Physical Society Keithley award

Dr.Wannberg wins the Keithley award for his pioneering work with Photoelectron spectroscopy.
2010

OMICRON

First low temperature NANOPROBE created

Low temperature surface research continues to grow, and OMICRON create a nanoprobe capable of topographical analysis of materials under these conditions.

2010

SCIENTA SENSOR SYSTEMS

20th Moblie system installed (IMS)

A milestone is reached by Sensor Systems as they deliver their 20th system into the field. SAUNA detectors are now delployed worldwide.
2011

OMICRON

First sub 0.1meV resolution results published

10 Years after the first 1meV, technology has advanced so far that OMICRON reveal the first 0.1meV resolution results for Spectroscopy a tenfold improvement.
2012

SCIENTA AB

Wins R&D award for the development of the NANOPROBE

The design of and the subsequent research from the Nanoprobe is recognised with a Research and Design award.

2013

SCIENTA AB

The DA30, first 3rd generation hemispherical ARPES spectrometer with deflector lens

The R4000 analyser is launched, with patented design and an unrilvaled performance, that remains the technical benchmark to this day. .
2015

SCIENTA AB

Patent on Deflector Lens approved

A patent is granted on a technological advancement that further enhances the performance of R4000 using a refined deflector lens focussing technique.
2016

SCIENTA OMICRON

First Hard X-ray Photoemission system launched

HAXPES lab. the world's first true hard X-ray photoemission system for home labs, featuring 9keV X-rays relesed. A scientific technique previously reserved for synchrotron users is made available for all.

2017

SCIENTA OMICRON

The DRYCOOL Fermi, the most advanced Scanning Probe Microscope with closed cycle cooler launched

The Drycoler Fermi instrument allows researchers with no access to liquid Helium to image surfaces with atomic resolution at a temperature of -263 degrees Celsius. This is a milestone in Scanning Probe Microscopy.
2018

SCIENTA OMICRON

World’s first HAXPES-lab systems shipped to customers in Asia and Europe

In Q4 2018, Scienta Omicron shipped HAXPES-lab systems to customers in advanced and applied research. For the first time, customer will be able to measure bulk XPS in a laboratory.
2020

SCIENTA OMICRON

Scienta Omicron’s first DA20 analyser has been shipped!

During 2019 Scienta Omicron developed and released a new electron analyser for ARPES and XPS, the DA20. The new DA20 is designed not only to avoid sample rotation, but is also optimised for the measurement of photoelectrons with low kinetic energies, making it a great product for time resolved ARPES (tr-ARPES).